Semiconductor device and manufacturing method of semiconductor device
AssigneeKabushiki Kaisha Toshiba
InventorMitsuyoshi ENDO
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AssigneeKabushiki Kaisha Toshiba
InventorMitsuyoshi ENDO
Estimating the term…
According to one embodiment, a manufacturing method of a semiconductor device includes the transferring a first group from a first support to a second support; the deforming the second support to convert each pitch of the semiconductor chips in the first group transferred on the second support into a second pitch different from the first pitch; the forming an insulating layer around each of the semiconductor chips, the insulating layer covering each of the semiconductor chips in the first group arranged in the second pitch; and the dicing the insulating layer. The first group is selected from a plurality of semiconductor chips supported by the first support. The plurality of semiconductor chips is arranged in an initial pitch. The first group is arranged in a first pitch being longer than the initial pitch.
A manufacturing method of a semiconductor device comprising:
A manufacturing method of a semiconductor device comprising:
A semiconductor device comprising:
Dependencies are inferred from the claim text.