Semiconductor device
AssigneeRenesas Electronics Corporation
InventorsYasuhiro OKAMOTO, Yuji ANDO, Tatsuo NAKAYAMA, Takashi INOUE, Kazuki OTA
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AssigneeRenesas Electronics Corporation
InventorsYasuhiro OKAMOTO, Yuji ANDO, Tatsuo NAKAYAMA, Takashi INOUE, Kazuki OTA
Estimating the term…
A semiconductor device including a field effect transistor including a substrate, a lower barrier layer provided on the substrate, a channel layer provided on the lower barrier layer, an electron supplying layer provided on the channel layer, a source electrode and a drain electrode provided on the electron layer, and a gate electrode provided between the source electrode and the drain electrode. The lower barrier layer includes a composition of In1-zAlzN (0≦z≦1). The channel layer includes a composition of AlxGa1-xN (0≦x≦1). A recess is provided in a region between the source electrode and the drain electrode, wherein the recess goes through the electron supplying layer to a depth that exposes the channel layer, and the gate electrode is disposed on a gate insulating film that covers a bottom surface and an inner wall surface of the recess.
A semiconductor device including a field effect transistor comprising:
A semiconductor device including a field effect transistor comprising:
Dependencies are inferred from the claim text.