Semiconductor device and manufacturing method thereof
AssigneeKabushiki Kaisha Toshiba
InventorsHiroshi OHTA, Masaru IZUMISAWA, Syotaro ONO, Hiroaki YAMASHITA, Takashi OKUHATA
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AssigneeKabushiki Kaisha Toshiba
InventorsHiroshi OHTA, Masaru IZUMISAWA, Syotaro ONO, Hiroaki YAMASHITA, Takashi OKUHATA
Estimating the term…
A semiconductor device includes a first semiconductor region of a first conductivity type, an element region, a terminal region, and a second electrode. The element region includes a second semiconductor region of a second conductivity type, a third semiconductor region of the second conductivity type, a fourth semiconductor region of the first conductivity type, a gate electrode, and a first electrode. The terminal region includes a fifth semiconductor region of the second conductivity type, and a sixth semiconductor region of the second conductivity type. The terminal region surrounds the element region. The fifth semiconductor region is provided within the first semiconductor region. A plurality of the fifth semiconductor regions are provided along a second direction. The sixth semiconductor region is provided between the first semiconductor region and the fifth semiconductor region. A dopant of the sixth semiconductor region is higher than a dopant concentration of the fifth semiconductor region.
A semiconductor device comprising:
A method of manufacturing a semiconductor device, comprising:
A semiconductor device, comprising:
Dependencies are inferred from the claim text.