Nonvolatile semiconductor memory device and method of manufacturing the same
AssigneeKabushiki Kaisha Toshiba
InventorsKatsuyuki SEKINE, Masaaki Higuchi, Masao Shingu, Hirokazu Ishigaki, Naoki Yasuda
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AssigneeKabushiki Kaisha Toshiba
InventorsKatsuyuki SEKINE, Masaaki Higuchi, Masao Shingu, Hirokazu Ishigaki, Naoki Yasuda
Estimating the term…
According to an embodiment, a nonvolatile semiconductor memory device comprises a plurality of conductive layers stacked in a first direction via an inter-layer insulating layer. In addition, the nonvolatile semiconductor memory device comprises: a semiconductor layer having the first direction as a longer direction; a tunnel insulating layer contacting a side surface of the semiconductor layer; a charge accumulation layer contacting a side surface of the tunnel insulating layer; and a block insulating layer contacting a portion facing the conductive layer, of a side surface of the charge accumulation layer. Moreover, the portion facing the conductive layer, of the charge accumulation layer is thinner compared to a portion facing the inter-layer insulating layer, of the charge accumulation layer.
A nonvolatile semiconductor memory device, comprising:
A method of manufacturing a nonvolatile semiconductor memory device, comprising:
Dependencies are inferred from the claim text.