Plasma processing method
AssigneeHitachi High-Technologies Corporation
InventorsMiyako MATSUI, Kenetsu YOKOGAWA, Tadamitsu KANEKIYO, Tetsuo ONO, Kazunori SHINODA
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi High-Technologies Corporation
InventorsMiyako MATSUI, Kenetsu YOKOGAWA, Tadamitsu KANEKIYO, Tetsuo ONO, Kazunori SHINODA
Estimating the term…
A plasma processing method includes: a first step of introducing a gas having reactivity with a film to be processed disposed in advance on a top surface of a wafer into a processing chamber to form an adhesion layer on the film; a second step of expelling a part of the gas remaining in the processing chamber while supply of the gas having reactivity is stopped; a third step of introducing a rare gas into the processing chamber to form a plasma and desorbing reaction products of the adhesion layer and the film to be processed using particles and vacuum ultraviolet light in the plasma; and a fourth step of expelling the reaction products while the plasma is not formed.
A plasma processing method comprising:
Dependencies are inferred from the claim text.