Method and Apparatus for Mass Spectrometry
AssigneeThermo Fisher Scientific (Bremen) GmbH
InventorAlexander Alekseevich MAKAROV
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Abstract
A method for analysing ions according to their mass-to-charge ratio and mass spectrometer for performing the method, comprising directing a collimated ion beam along an ion path from an ion source to an ion detector, causing a portion of the ion beam to contact one or more surfaces prior to reaching the ion detector, wherein the method comprises providing a coating on and/or heating the one or more surfaces to reduce variation in their surface patch potentials. The method is applicable to multi-reflection time-of-flight (MR TOF) mass spectrometry.
Claims22
A method of analyzing ions according to their mass-to-charge ratio comprising directing a collimated ion beam along an ion path from an ion source to an ion detector, causing a portion of the ion beam to pass one or more surfaces prior to reaching the ion detector, wherein the method further comprises reducing variation in surface patch potentials of the one or more surfaces by performing at least one of:
- (i) providing a coating on the one or more surfaces, and (ii) heating the one or more surfaces;
- and
- wherein as the ion beam travels from the ion source to the ion detector, an outer portion of the beam is clipped by the one or more surfaces, whereby the one or more surfaces form collimating apertures.
A method of analysing ions according to their mass-to-charge ratio comprising directing a collimated ion beam along an ion path from an ion source to an ion detector, causing a portion of the ion beam to pass one or more surfaces prior to reaching the ion detector, wherein the method comprises providing a coating on and/or heating the one or more surfaces to reduce variation in their surface patch potentials, wherein the coating has a surface patch potential variation of less than 1 V.
Dependencies are inferred from the claim text.