Power Loss Test Device And Method For Nonvolatile Memory Device
AssigneeElixir Flash Technology Co., Ltd.
InventorSung-woo Lee
Life of this patent
Estimating the term…
Abstract
A power loss test apparatus for a non-volatile memory device includes a test-board including at least one socket into which at least one test target non-volatile memory device is inserted, a micro controller that determines whether to supply power to the test target non-volatile memory device based on current consumption information or operating state information of the test target non-volatile memory device, and a tester that performs a power loss test for the test target non-volatile memory device based on whether the power is supplied to the test target non-volatile memory device.
Claims15
A power loss test apparatus for a non-volatile memory device comprising:
- a test-board including at least one socket into which at least one test target non-volatile memory device is inserted;
- a micro controller configured to determine whether to supply power to the test target non-volatile memory device based on current consumption information or operating state information of the test target non-volatile memory device;
- and
- a tester configured to perform a power loss test for the test target non-volatile memory device based on whether the power is supplied to the test target non-volatile memory device.
A method of performing a power loss test for a non-volatile memory device, the method comprising:
- generating, at a test-board connected to at least one test target non-volatile memory device, current consumption information or operating state information of the test target non-volatile memory device;
- determining, at a micro controller, whether to supply power to the test target non-volatile memory device based on the current consumption information or the operating state information;
- and
- performing, at a tester, the power loss test for the test target non-volatile memory device based on whether the power is supplied to the test target non-volatile memory device.
Dependencies are inferred from the claim text.