Method of performing wear management in non-volatile memory devices
AssigneeTranscend Information, Inc.
InventorsTseng-Ho Li, Yung-Ju Chen
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AssigneeTranscend Information, Inc.
InventorsTseng-Ho Li, Yung-Ju Chen
Estimating the term…
A method is provided for performing wear management in a non-volatile memory device which includes a plurality of storage units. A first error count associated with the amount of error bits generated in a specific storage unit during a first access is acquired. A second error count associated with an amount of error bits generated in the specific storage unit during a second access is retrieved, wherein the second access occurs earlier than the first access. An early retirement threshold is set to a first value when the difference between the first error count and the second error count does not exceed the predetermined value, or set to a second value smaller than the first value when the difference between the first error count and the second error count exceeds the predetermined value. The specific storage unit is marked as a bad storage unit when the first error count exceeds the early retirement threshold.
A method of performing wear management in a non-volatile memory device which includes a plurality of storage units, the method comprising:
A method of performing wear management in a read operation of a flash-type memory device which includes a plurality of blocks each having a plurality of pages, the method comprising:
A method of performing wear management in a write operation of a flash-type memory device which includes a plurality of blocks each having a plurality of pages, the method comprising:
Dependencies are inferred from the claim text.