Method and device for the indirect determination of a specific formulation during extrusion
AssigneeWindmoller & Holscher
InventorTorsten SCHMITZ
Life of this patent
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Abstract
The invention relates to a method for the indirect determination of a specific formulation with an extrusion process in an extrusion device (10) comprising the following steps: determination of measurement data of at least one processing parameter of the extrusion process of the extrusion device (10), comparing the determined measurement data with saved data saved in relation to the specific formulation of the same processing parameter, determination of the deviation of the measurement data from the saved data of the same processing parameters and comparing of the deviation with a predefined deviation threshold.
Claims21
Method for the indirect determination of a specific formulation with an extrusion process in an extrusion device comprising the following steps:
- determination of measurement data of at least one processing parameter of the extrusion process of the extrusion device,
- comparing the determined measurement data with saved data saved in relation to the specific formulation of the same processing parameter,
- determination of the deviation of the measurement data from the saved data of the same processing parameters and
- comparing of the deviation with a predefined deviation threshold,
- wherein in dependence of the determined measurement data an appropriate specific formulation is requested in the retained saved data of the same processing parameter.
(canceled)
Dependencies are inferred from the claim text.