Combined handheld xrf and oes systems and methods

A method of analyzing a sample using both XRF and LIBS subsystems, the method comprising:

• operating an X-ray source at a fixed medium voltage to deliver X-rays to a sample without passing through a mechanized filter to analyze the sample for a first group of elements, namely, transition and/or heavy metals,
• detecting fluoresced X-rays from the sample;
• processing an output of the detector to determine the concentration of one or more elements of the first group in the sample;
• employing a low power laser source to deliver a laser beam to the sample to analyze the sample for a second group of elements, namely, C, Be, Li, Na, and/or B and to analyze the sample for a third group of elements, namely, Al, Si, Mg, Cd, Ag, In, Sn, Sb, and/or Ba, and/or rare earth elements;
• analyzing optical emissions from the sample using a narrow wavelength range spectrometer subsystem;
• and
• processing an output of the narrow wavelength range spectrometer subsystem to determine the concentration of one or more elements of the second and/or third groups in the sample.

A combined handheld XRF and OES system comprising:

• an x-ray tube for delivering x-rays to a sample;
• a detector for detecting fluoresced radiation from the sample;
• a laser source for delivering a laser beam to the sample;
• a spectrometer subsystem for analyzing optical emissions from the sample;
• and
• a controller subsystem configured to:
• operate the x-ray tube at a predetermined fixed power setting to analyze a first group of elements,
• process an output of the detector to determine the concentration of elements of the first group present in the sample,
• operate the laser source to analyze a second group of elements, and
• process an output of the spectrometer subsystem to determine the concentration of elements of the second group present in the sample.

A method of analyzing a sample using both x-ray fluorescence and optical emissions spectrometry, the method comprising:

• directing x-rays to a sample from an x-ray source operated at a predetermined power setting to analyze a first group of elements;
• detecting fluoresced radiation from the sample to detect the concentration of elements of the first group present in the sample;
• directing a laser beam to the sample to analyze a second group of elements;
• and
• analyzing emissions from the sample to detect the concentration of elements of the second group present in the sample.