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US 2015/0346360 A1Published application
Crystal material, radiation detector, imaging apparatus, nondestructive inspection apparatus, and lighting apparatus
AssigneeTohoku University
InventorsAkira YOSHIKAWA, Shunsuke KUROSAWA, Yuui YOKOTA, Yasuhiro SHOJI, Akira SUZUKI, Toetsu SHISHIDO
Life of this patent
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Abstract
A crystal material represented by a general formula (1): (Gd1-x-y-zLaxMEyREz)2MM2O7 (1), where ME is at least one selected from Y, Yb, Sc, and Lu; RE is Ce or Pr; MM is at least one selected from Si and Ge; and ranges of x, y, and z are represented by the following (i): (i) 0.0≦x+y+z<1.0, 0.05≦x+z<1.0, 0.0≦y<1.0, and 0.0001≦z<0.05 (where, when RE is Ce, y=0 is an exception).
Claims14
1-13. (canceled)
A crystal material represented by a general formula (1):
- (Gd1-x-y-zLaxMEyREz)2MM2O7 (1)
- where ME is at least one selected from Y, Yb, Sc, and Lu;
- RE is Ce or Pr;
- MM is at least one selected from Si and Ge;
- and ranges of x, y, and z are represented by the following (i):
- (i) 0.0≦x+y+z<1.0, 0.05≦x+z<1.0, 0.0≦y<1.0, and 0.0001≦z<0.05 (where, when RE is Ce, y=0 is an exception).
3 more elements
A nondestructive inspection apparatus comprising the radiation detector according to 21.
Dependencies are inferred from the claim text.