Method and apparatus for optimizing depth information
AssigneeAltek Semiconductor Corp.
InventorsYu-Chia Chung, Wen-Yan Chang, Chia-Chun Tseng, Yun-Chin Lee
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AssigneeAltek Semiconductor Corp.
InventorsYu-Chia Chung, Wen-Yan Chang, Chia-Chun Tseng, Yun-Chin Lee
Estimating the term…
Method and apparatus for optimizing depth information are provided. One of a left image and a right image is divided into a plurality of segmentations for obtaining a plurality of segmentation maps. A necessary repair depth map is obtained, and the necessary repair depth map is partitioned into a plurality of depth planes according to a plurality of primary depth values and a camera parameter. The primary depth values are recorded in the necessary repair depth map having a plurality of holes. A plurality of optimized depth values are respectively generated for the holes in each of the depth planes by using the segmentation maps, and the optimized depth values are filled into the depth planes to obtain an optimized depth map.
A method for optimizing depth information, for an electronic device, wherein a left image and a right image are generated through shooting of a three dimensional imaging system, and the method comprises:
An apparatus for optimizing depth information, wherein the apparatus obtains a left image and a right image through shooting of a three dimensional imaging system, and comprises:
Dependencies are inferred from the claim text.