Segmented Planar Calibration for Correction of Errors in Time of Flight Mass Spectrometers
AssigneeMicromass UK Limited
InventorsDavid J. Langridge, Jason Lee Wildgoose
Life of this patent
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Abstract
An ion detector system for a mass spectrometer is disclosed comprising an ion detector comprising an array of detector elements. The ion detector system is arranged to correct for tilt and non-linear aberrations in an isochronous plane of ions. The ion detector system generates separate first mass spectral data sets for each detector element and then applies a calibration coefficient to each of the first mass spectral data sets to produce a plurality of second calibrated mass spectral data sets. The plurality of second calibrated mass spectral data sets are then combined to form a composite mass spectral data set.
Claims15
An ion detector system for a mass spectrometer, said system comprising, an ion detector including an array having detector elements wherein said ion detector system is arranged and adapted:
- (i) to generate separate mass spectral data for each detector element to form a plurality of first mass spectral data sets;
- (ii) to apply a calibration coefficient to said plurality of first mass spectral data sets to produce a plurality of calibrated mass spectral data sets;
- and
- (iii) to combine said plurality of calibrated mass spectral data sets to form a composite mass spectral data set.
A method of detecting ions with an ion detector system including an ion detector having a 1D or 2D array of detector elements, said method comprising:
- (i) generating separate first mass spectral data for each detector element to form a plurality of first mass spectral data sets;
- (ii) applying a calibration coefficient to each of said first mass spectral data sets to produce a plurality of second calibrated mass spectral data sets;
- and
- (iii) combining said plurality of second calibrated mass spectral data sets to form a composite mass spectral data set.
Dependencies are inferred from the claim text.