Test design assistance device, test design assistance method, program and computer-readable medium
AssigneeFuji Xerox Co., Ltd.
InventorKoichi AKIYAMA
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AssigneeFuji Xerox Co., Ltd.
InventorKoichi AKIYAMA
Estimating the term…
A test design assistance device 10 acquires information about the number of levels indicating the number of values which can be obtained for each factor in a plurality of factors of a test target, selects a matrix capable of allocating all of factors in a maximum number of levels information in the matrix capable of allocating factors in multilevel generated based on an orthogonal table, sets the maximum number of the number of levels in the levels of factors which are not allocated as a focused number of levels, and allocates factors in the focused number of levels to the matrix when the number of columns capable of allocating the factors in the focused number of levels is equal to greater than the number of factors in the focused number of levels, in the selected matrix.
A test design assistance device comprising:
A test design assistance method causing a computer to execute a process comprising:
A non-transitory computer readable medium storing a program causing a computer to execute a process for test design assistance, the process comprising:
Dependencies are inferred from the claim text.