Test support device and test support method
AssigneeNEC Corporation
InventorTakayuki Kuroda
Life of this patent
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AssigneeNEC Corporation
InventorTakayuki Kuroda
Estimating the term…
A test support device which can test all configurations of a system including a specific system component, comprehensively and quickly, is provided. A test support device (100) includes a storage unit (102) and an extraction processing unit (101). A configuration of a system is defined with a plurality of functionalities to be maintained by the system and a set of programs implementing the functionalities respectively. The storage unit (102) stores component-relation information (201) which indicates an identifier of each of one or more systems, an identifier of each of a plurality of functionalities to be maintained by each of the systems, and an identifier of each of one or more programs being capable of implementing each of the functionalities. The extraction processing unit (101) extracts, when a functionality or a program is specified, a configuration of a system including the specified functionality or the specified program on the basis of the component-relation information (201), and outputs the extracted configuration of a system.
A test support device comprising:
A test support method comprising:
A non-transitory computer readable storage medium recording thereon a program causing a computer to perform a method comprising:
A test support device comprising:
Dependencies are inferred from the claim text.