Semiconductor device

A semiconductor device comprising:

• a movable portion;
• a first scan line driver circuit;
• a second scan line driver circuit;
• and
• a control portion,
• wherein the movable portion includes a first region and a second region,
• wherein the first region includes a plurality of transistors arranged in a matrix,
• wherein the second region includes a plurality of transistors arranged in a matrix,
• wherein the first scan line driver circuit includes first to k-th shift registers,
• wherein k is an integer of two or more,
• wherein the second scan line driver circuit includes (k+1)th to h-th shift registers,
• wherein h is an integer of four or more, where (k+1)<h,
• wherein the k-th shift register is connected to the (k+1)th shift register through a switch,
• wherein the first scan line driver circuit is configured to drive a plurality of transistors included in the first region,
• wherein the second scan line driver circuit is configured to drive a plurality of transistors included in the second region,
• wherein the control portion is configured to supply a start pulse to the first scan line driver circuit or the second scan line driver circuit, and
• wherein the movable portion is foldable between the first region and the second region.

A semiconductor device comprising:

• a movable portion;
• a first scan line driver circuit;
• a second scan line driver circuit;
• a third scan line driver circuit;
• and
• a control portion,
• wherein the movable portion includes a first region, a second region, and a third region,
• wherein the first region includes a plurality of transistors arranged in a matrix,
• wherein the second region includes a plurality of transistors arranged in a matrix,
• wherein the third region includes a plurality of transistors arranged in a matrix,
• wherein the first scan line driver circuit includes first to k-th shift registers,
• wherein k is an integer of two or more,
• wherein the second scan line driver circuit includes (k+1)th to h-th shift registers,
• wherein h is an integer of four or more, where (k+1)<h,
• wherein the third scan line driver circuit includes (h+1)th to t-th shift registers,
• wherein t is an integer of six or more, where (h+1)<t,
• wherein the k-th shift register is connected to the (k+1)th shift register through a first switch,
• wherein the h-th shift register is connected to the (h+1)th shift register through a second switch,
• wherein the first scan line driver circuit is configured to drive a plurality of transistors included in the first region,
• wherein the second scan line driver circuit is configured to drive a plurality of transistors included in the second region,
• wherein the third scan line driver circuit is configured to drive a plurality of transistors included in the third region,
• wherein the control portion is configured to turn on the first switch and supply a start pulse to the first scan line driver circuit, is configured to turn off the first switch, turn on the second switch, and supply a start pulse to the second scan line driver circuit, and is configured to turn off the first and second switches and supply a start pulse to the third scan line driver circuit, and
• wherein the movable portion is foldable between the first region and the second region and between the second region and the third region.