Debugging system and method
AssigneeXcerra Corporation
InventorsTODOR K. PETROV, IAN HARRISON
Life of this patent
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Abstract
A method, computer program product, and computing system for monitoring a first group of signals present on a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform while executing at least a portion of an automated test process on the automated test platform. A second group of signals present on a second group of conductive paths is monitored while executing the at least a portion of the automated test process on the automated test platform. The first group of signals and the second group of signals are temporally aligned, thus defining a group of temporally aligned signals.
Claims21
A computer-implemented method, executed on a computing device, the computer-implemented method comprising:
- monitoring a first group of signals present on a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform while executing at least a portion of an automated test process on the automated test platform;
- monitoring a second group of signals present on a second group of conductive paths while executing the at least a portion of the automated test process on the automated test platform;
- and
- temporally aligning the first group of signals and the second group of signals, thus defining a group of temporally aligned signals.
A computer program product residing on a computer readable medium having a plurality of instructions stored thereon which, when executed by a processor, cause the processor to perform operations comprising:
- monitoring a first group of signals present on a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform while executing at least a portion of an automated test process on the automated test platform;
- monitoring a second group of signals present on a second group of conductive paths while executing the at least a portion of the automated test process on the automated test platform;
- and
- temporally aligning the first group of signals and the second group of signals, thus defining a group of temporally aligned signals.
A computing system including a processor and memory configured to perform operations comprising:
- monitoring a first group of signals present on a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform while executing at least a portion of an automated test process on the automated test platform;
- monitoring a second group of signals present on a second group of conductive paths while executing the at least a portion of the automated test process on the automated test platform;
- and
- temporally aligning the first group of signals and the second group of signals, thus defining a group of temporally aligned signals.
Dependencies are inferred from the claim text.