Debugging system and method
AssigneeXcerra Corporation
InventorsTODOR K. PETROV, IAN HARRISON
Life of this patent
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Abstract
A method, computer program product, and computing system for defining a first group of transient values for a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform. A monitoring subsystem is electrically coupled to the first group of conductive paths. A first group of signals present on the first group of conductive paths is monitored while executing at least a portion of an automated test process on the automated test platform to determine if any of the first group of signals exceeds any of the first group of transient values.
Claims21
A computer-implemented method, executed on a computing device, the computer-implemented method comprising:
- defining a first group of transient values for a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform;
- electrically coupling a monitoring subsystem to the first group of conductive paths;
- and
- monitoring a first group of signals present on the first group of conductive paths while executing at least a portion of an automated test process on the automated test platform to determine if any of the first group of signals exceeds any of the first group of transient values.
A computer program product residing on a computer readable medium having a plurality of instructions stored thereon which, when executed by a processor, cause the processor to perform operations comprising:
- defining a first group of transient values for a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform;
- electrically coupling a monitoring subsystem to the first group of conductive paths;
- and
- monitoring a first group of signals present on the first group of conductive paths while executing at least a portion of an automated test process on the automated test platform to determine if any of the first group of signals exceeds any of the first group of transient values.
A computing system including a processor and memory configured to perform operations comprising:
- defining a first group of transient values for a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform;
- electrically coupling a monitoring subsystem to the first group of conductive paths;
- and
- monitoring a first group of signals present on the first group of conductive paths while executing at least a portion of an automated test process on the automated test platform to determine if any of the first group of signals exceeds any of the first group of transient values.
Dependencies are inferred from the claim text.