Debugging system and method
AssigneeXcerra Corporation
InventorsTODOR K. PETROV, Ian Harrison
Life of this patent
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Abstract
A method, computer program product, and computing system for electrically coupling a monitoring subsystem to a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform. One or more signals present on the first group of conductive paths are monitored while executing at least a portion of an automated test process on the automated test platform. The monitoring subsystem is electrically coupled to a second group of conductive paths within the debugging coupler. One or more signals present on the second group of conductive paths are monitored while executing the at least a portion of the automated test process on the automated test platform.
Claims21
A computer-implemented method, executed on a computing device, the computer-implemented method comprising:
- electrically coupling a monitoring subsystem to a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform;
- monitoring a first group of signals present on the first group of conductive paths while executing at least a portion of an automated test process on the automated test platform;
- electrically coupling the monitoring subsystem to a second group of conductive paths within the debugging coupler;
- and
- monitoring a second group of signals present on the second group of conductive paths while executing the at least a portion of the automated test process on the automated test platform.
A computer program product residing on a computer readable medium having a plurality of instructions stored thereon which, when executed by a processor, cause the processor to perform operations comprising:
- electrically coupling a monitoring subsystem to a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform;
- monitoring a first group of signals present on the first group of conductive paths while executing at least a portion of an automated test process on the automated test platform;
- electrically coupling the monitoring subsystem to a second group of conductive paths within the debugging coupler;
- and
- monitoring a second group of signals present on the second group of conductive paths while executing the at least a portion of the automated test process on the automated test platform.
A computing system including a processor and memory configured to perform operations comprising:
- electrically coupling a monitoring subsystem to a first group of conductive paths within a debugging coupler that is configured to be releasably electrically coupleable to a test head of an automated test platform;
- monitoring a first group of signals present on the first group of conductive paths while executing at least a portion of an automated test process on the automated test platform;
- electrically coupling the monitoring subsystem to a second group of conductive paths within the debugging coupler;
- and
- monitoring a second group of signals present on the second group of conductive paths while executing the at least a portion of the automated test process on the automated test platform.
Dependencies are inferred from the claim text.