Debugging system and method
AssigneeXcerra Corporation
InventorsTODOR K. PETROV, IAN HARRISON
Life of this patent
Estimating the term…
Abstract
A debugging system for debugging an automated test process used on an automated test platform. The debugging system includes a debugging coupler configured to be releasably electrically coupleable to a test head of the automated test platform. A debugging subsystem is electrically coupled to the debugging coupler and includes a signal generator configured to apply one or more signals to one or more conductive paths within the debugging coupler.
Claims20
A debugging system for debugging an automated test process used on an automated test platform, the debugging system comprising:
- a debugging coupler configured to be releasably electrically coupleable to a test head of the automated test platform;
- and
- a debugging subsystem electrically coupled to the debugging coupler and including a signal generator configured to apply one or more signals to one or more conductive paths within the debugging coupler.
A debugging system for debugging an automated test process used on an automated test platform, the debugging system comprising:
- a debugging coupler configured to be releasably electrically coupleable to a test head of the automated test platform;
- and
- a debugging subsystem electrically coupled to the debugging coupler and including:
- a signal generator configured to apply one or more signals to one or more conductive paths within the debugging coupler, and
- a monitoring subsystem configured to monitor the signals present on one or more conductive paths within the debugging coupler.
A debugging system for debugging an automated test process used on an automated test platform, the debugging system comprising:
- a debugging coupler configured to be releasably electrically coupleable to a test head of the automated test platform;
- a debugging subsystem electrically coupled to the debugging coupler and including:
- a signal generator configured to apply one or more signals to one or more conductive paths within the debugging coupler, and
- a monitoring subsystem configured to monitor the signals present on one or more conductive paths within the debugging coupler;
- and
- a matrix switch for selectively coupling one or more of the signal generator and the monitoring subsystem to the one or more conductive paths within the debugging coupler.
Dependencies are inferred from the claim text.