System and method for converging current with target current in device under test
AssigneeKeysight Technologies, Inc.
InventorsKatsuhito Iwasaki, Masaharu Goto, Tomonori Ura
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AssigneeKeysight Technologies, Inc.
InventorsKatsuhito Iwasaki, Masaharu Goto, Tomonori Ura
Estimating the term…
A test system measures parameters of a device under test (DUT), including a transistor. The test system includes a first voltage source unit for supplying a gate voltage; a second voltage source unit for supplying one of a drain voltage or a source voltage, the second voltage source having a current measurement device for detecting one of a drain current or a source current flowing through the transistor, respectively; a feedback unit for outputting a feedback current, based on the one of the drain or source currents; and an error amplifier for outputting a feedback control signal, based on comparison of the feedback current and a target current value. The first voltage source unit adjusts the gate voltage based on the feedback control signal so that the one of the drain or source currents converges to match the target current value.
A test system for measuring at least one parameter of a device under test (DUT) comprising a transistor, the system comprising:
A test system for measuring at least one parameter of a device under test (DUT) comprising a diode, the system comprising:
A test system for measuring at least one parameter of a device under test (DUT) comprising a transistor, the system comprising:
Dependencies are inferred from the claim text.