US 2015/0316605 A1 · SOFTWARE-BASED SELF-TEST AND DIAGNOSIS USING ON-CHIP MEMORY

Abstract

Embedded processor-based self-test and diagnosis using the compressed test data is described for ICs having on-chip memory. Techniques for compressing the test data before the compressed test data is transferred to a device under test (DUT) are also described. A modified LZ77 algorithm can be used to compress strings of test data in which don't care bits are handled by assigning a value to the don't care bits according to a longest match in the window as the data is being encoded. The compressed test data can be decompressed at the DUT using a software program transferred by the automated test equipment (ATE) to the DUT with the compressed test data. Decompression and diagnostics can be carried out at the DUT using an embedded processor and the on-chip memory. Results from the diagnostics can be read by the ATE.

Claims25

Dependent claims

A method of testing and diagnosis for integrated circuits (ICs) having on-chip memory, comprising:

receiving compressed test data into an on-chip memory of an IC;
decompressing the compressed test data stored in the on-chip memory;
writing decompressed test data back into the on-chip memory;
and
enabling a test mode of a test module of the IC to read the decompressed test data from the on-chip memory, apply the decompressed test data to a module under test within the IC, and store test responses from the module under test in the on-chip memory.

2 more elements

An integrated circuit (IC) with design-for-test (DfT) circuitry, the IC comprising:

an on-chip memory;
at least one scan chain for testing a module of the IC;
and
a test control module receiving test signals and outputting control signals for writing and reading to the on-chip memory, control signals for applying test data to the at least one scan chain, and control signals to enable test responses from the at least one scan chain to be written to the on-chip memory.

1 more element

Dependencies are inferred from the claim text.

Software-based self-test and diagnosis using on-chip memory

Life of this patent

Software-based self-test and diagnosis using on-chip memory

Life of this patent

Abstract

Claims25