US 2015/0316601 A1 · IN-CHIP STATIC-CURRENT DEVICE FAILURE DETECTING METHODS AND APPARATUS

Abstract

A method for detecting static-current failure devices in a chip is provided. The method includes providing a chip and determining existence of a static-current failure device in the chip. The method also includes detecting positions of a plurality of hotspots in the chip when the existence of the static-current failure devices is determined; and selecting a common circuit path according to position information of the hotspots in a circuit layout file of the chip. Further, the method includes converting a circuit layout of the common circuit path into a corresponding electrical diagram and marking the positions of the plurality of hotspots on corresponding positions on the electrical diagram; and detecting a shared device of the hotspots in the electrical diagram. Further, the method includes marking a position of the shared device in the circuit layout as a position of a static-current failure device.

Claims20

Dependent claims

A method for detecting a static-current failure device in a chip, comprising:

providing a to-be-tested chip;
determining existence of a static-current failure device in the to-be-tested chip;
detecting positions of a plurality of hotspots in the to-be-tested chip when the existence of the static-current failure devices is determined;
selecting a common circuit path of the plurality of hotspots according to position information of the plurality of hotspots in a circuit layout file of the to-be-tested chip;
converting a circuit layout of the common circuit path into a corresponding electrical diagram and marking the hotspot positions onto corresponding positions on the electrical diagram;
detecting a shared device of the hotspots in the electrical diagram;
and
marking a position of the shared device in the circuit layout as a position of a static-current failure device.

5 more elements

A detection apparatus of a static-current failure device in a chip, comprising:

a first determination unit configured to determine existence of a static-current failure device in a to-be-tested chip;
a first detection unit configured to detect positions of a plurality of hotspots in the to-be-tested chip if the existence of the static-current failure device is determined;
a selection unit configured to select a common path of the plurality of hotspots according to position information of the hotspots in a circuit layout file a conversion unit configured to convert a circuit layout of the common circuit path into a corresponding electrical diagram;
a first marking unit configured to mark the hotspot positions onto corresponding positions on the electrical diagram;
a second detecting unit configured to detect a shared device of the hotspots in the electrical diagram;
and
a second marking unit configured to mark a position of the shared device on the circuit layout as the position of a static-current failure device.

4 more elements

Dependencies are inferred from the claim text.

In-chip static-current device failure detecting methods and apparatus

Life of this patent

In-chip static-current device failure detecting methods and apparatus

Life of this patent

Abstract

Claims20