Low electromagnetic interference voltage measurement system

A method in a low electromagnetic interference (“EMI”) voltage measurement system comprising:

• receiving, by an input selection device, a plurality of analog voltage signals and outputting one of the plurality of analog voltage signals;
• converting, by a converter circuit, at least a first analog voltage signal to a first digital signal and a second analog voltage signal to a second digital signal;
• providing, by a clock circuit, a clock signal to a counter circuit configured to output input selection logic wherein the clock signal is based on the discharge rate of a first voltage storage device, the clock signal occurring at a frequency that is below a predetermined threshold frequency such that EMI does not alter operation of a device under test adjacent the low EMI voltage measurement system;
• providing, by a counter circuit, input selection logic to the input selection device in response to the counter circuit receiving the clock signal wherein the input selection logic causes the input selection device to output one of the plurality of analog voltage signals;
• transmitting, by a fiber optic transmitter, the first digital signal to a fiber optic receiver and the second digital signal to the fiber optic receiver;
• receiving, by a receiver circuit, at least the transmitted first digital signal and the transmitted second signal wherein the receiver circuit includes a latching device configured to latch the first digital signal and to latch the second digital signal;
• and
• transmitting, by the receiver circuit, at least the latched first digital signal and the latched second digital signal in response to the latching device latching a predetermined threshold amount of digital signals wherein the transmitted latched digital signals are received by a computing device.

A low electromagnetic interference (“EMI”) voltage measurement system comprising:

• an input selection device configured to receive a plurality of analog voltage signals and output one of the plurality of analog voltage signals;
• a transmitter module coupled to the input selection device, the transmitter module configured to convert an analog voltage signal to a digital signal and transmit the digital signal;
• a receiver module coupled to the transmitter module and configured to receive the digital signal, the receiver module including a latching device configured to latch the digital signal and in response to latching a predetermined threshold amount of digital signals, the receiver module transmits the latched digital signals to a computing device;
• and
• a clock circuit coupled to the input selection device and configured to output a clock signal to cause the input selection device to output one of the plurality of analog voltage signals, wherein the clock signal occurs at a frequency that is below a predetermined threshold frequency such that EMI does not alter operation of a device under test adjacent the low EMI voltage measurement system.

A low electromagnetic interference (EMI) voltage measurement system comprising:

• an input selection device configured to receive a plurality of analog voltage signals and output one of the plurality of analog voltage signals;
• a converter circuit coupled to the input selection device, the converter circuit configured to convert at least a first analog voltage signal to a first digital signal, convert a second analog voltage signal to a second digital signal, and output a clock signal;
• a counter circuit coupled to the input selection device, the counter circuit configured to receive the clock signal and to provide input selection logic to the input selection device in response to receiving the clock signal;
• a logic circuit coupled to the converter circuit, the logic circuit configured to at least invert the first digital signal and invert the second digital signal;
• a fiber optic transmitter coupled to the logic circuit and configured to transmit the first digital signal to a fiber optic receiver and transmit the second digital signal to the fiber optic receiver;
• and
• a receiver circuit configured to receive at least the transmitted first digital signal and receive the transmitted second digital signal, the receiver circuit including a latching device configured to latch the first digital signal and to latch the second digital signal and in response to latching a predetermined amount of digital signals, the receiver circuit transmits the latched digital signals to a computing device;
• wherein the clock signal is based on the discharge rate of a voltage storage device, the clock signal occurring at a frequency that is below a predetermined threshold frequency such that EMI does not alter operation of a device under test adjacent the low EMI voltage measurement system.

A method of configuring and operating a low electromagnetic interference (“EMI”) voltage measurement testing system in proximity with a device under test comprising:

• providing a voltage testing system comprising a clock circuit;
• providing, by the clock circuit, a clock signal to a counter circuit configured to output input selection logic wherein the clock signal is based on the discharge rate of a first voltage storage device, the clock signal occurring at a frequency that is below a threshold frequency;
• providing an input selection device configured to receive a plurality of analog voltage signals and output one of the plurality of analog voltage signals;
• providing a converter circuit coupled to the input selection device, the converter circuit configured to convert at least a first analog voltage signal to a first digital signal and convert a second analog voltage signal to a second digital signal;
• providing a device under test having a receiver configured to operate in response to receiving a radio frequency (“RF”) signal;
• positioning the voltage testing system in close proximity to the device under test;
• determining, by an assessment module, a plurality of device under test electromagnetic interference (“EMI”) vulnerability characteristics comprising one or more operating signal frequencies of the device under test;
• configuring the voltage testing system comprising configuring the clock circuit to operate at a frequency other than the one or more operating signal frequencies of the device under test
• receiving, by the input selection device, a plurality of analog voltage signals and outputting one of the plurality of analog voltage signals;
• converting, by the converter circuit, at least a first analog voltage signal to a first digital signal and a second analog voltage signal to a second digital signal;
• providing, by a counter circuit, input selection logic to the input selection device in response to the counter circuit receiving the clock signal wherein the input selection logic causes the input selection device to output one of the plurality of analog voltage signals;
• providing a fiber optic interface cable coupled to an optical output signal interface section of a transmitter of the voltage testing system and an optical input signal interface section of a receiver of the voltage testing system;
• transmitting, by the fiber optic interface cable, the first digital signal to the optical input signal interface section of the receiver and the second digital signal to the optical input signal interface section of the receiver;
• receiving, by the optical input signal interface section of the receiver, at least the transmitted first digital signal and the transmitted second signal wherein the receiver includes a latching device configured to latch the first digital signal and to latch the second digital signal;
• and
• transmitting, by the receiver, at least the latched first digital signal and the latched second digital signal in response to the latching device latching a predetermined threshold amount of digital signals wherein the transmitted latched digital signals are received by a computing device;
• and
• generating a plurality of outputs comprising one or more digital data bytes.