Systems and Methods Eliminating False Defect Detections
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsBiow-Hiem Ong, CHIH-CHIANG TU, Chien-Hung Lai, JONG-YUH CHANG, Kuang-Yu Liu
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsBiow-Hiem Ong, CHIH-CHIANG TU, Chien-Hung Lai, JONG-YUH CHANG, Kuang-Yu Liu
Estimating the term…
A method for inspecting a manufactured product includes applying a first test regimen to the manufactured product to identify product defects. The first test regimen produces a first set of defect candidates. The method further includes applying a second test regimen to the manufactured product to identify product defects. The second test regimen produces a second set of defect candidates, and the second test regimen is different from the first test regimen. The method also includes generating a first filtered defect set by eliminating ones of the first set of defect candidates that are not indentified in the second set of defect candidates.
A method comprising:
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