Thickness determination and layer characterization using terahertz scanning reflectometry

A terahertz system for analyzing biological tissue, comprising:

• a platform configured to hold a substrate;
• a continuous wave terahertz source configured to generate terahertz radiation;
• an off-axis parabolic reflector configured to focus the terahertz radiation at a surface of the substrate;
• a beam splitter configured to direct a reflected beam from the sample holder to a detection system;
• a motion controller configured to move the platform,
• wherein on a condition that the motion controller adjusts a location of a focal point inside the substrate, a reflectance measurement is performed across a thickness of the substrate, wherein a thickness profile is determined from a blank substrate measurement and the biological tissue loaded substrate measurement, and
• wherein on a condition that the motion controller locks the focal point at the surface of the substrate, a real time reflectance measurement is performable upon placement of the biological tissue on the substrate;
• a spectrometer configured to measure spectral signatures of the biopsy tissues, wherein a benign and/or healthy tissue is measured and its spectrum is used as reference and a diseased tissue is measured and disease conditions may be assigned to spectral featured in comparison with the benign and/or healthy tissue and wherein spectra are used to identify cancer tumor and benign tumor;
• and
• a reconstruction module configured to covert a 3D scan data in to a 3D image of the tissue, wherein the image provides visual differences between the benign and/or healthy and diseased tissues.