Semiconductor device, magnetic memory device, and method of fabricating the same
AssigneeSamsung Electronics Co., Ltd.
InventorsByoungjae BAE, Jongchul PARK, Shin KWON, Inho KIM, Changwoo SUN
Life of this patent
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Abstract
A method of fabricating a semiconductor device includes forming conductive pillars on a substrate, sequentially forming a sacrificial layer and a molding structure between the conductive pillars, forming a conductive layer on the molding structure, such that the conductive layer is connected to the conductive pillars, removing the sacrificial layer to form an air gap, removing the molding structure to form an expanded air gap, and patterning the conductive layer to open the expanded air gap.
Claims23
A method of fabricating a semiconductor device, the method comprising:
- forming conductive pillars on a substrate;
- sequentially forming a sacrificial layer and a molding structure between the conductive pillars;
- forming a conductive layer on the molding structure, such that the conductive layer is connected to the conductive pillars;
- removing the sacrificial layer to form an air gap;
- removing the molding structure to form an expanded air gap;
- and
- patterning the conductive layer to open the expanded air gap.
A method of fabricating a magnetic memory device, the method comprising:
- preparing a substrate with a cell array region and a peripheral circuit region;
- forming conductive pillars on the cell array region;
- sequentially forming a sacrificial layer and a molding structure on the conductive pillars;
- forming a conductive layer on the molding structure;
- removing the sacrificial layer to form an air gap between the conductive pillars;
- performing a first patterning process using a mask pattern covering the cell array region and exposing the peripheral circuit region to expose the molding structure;
- removing the molding structure exposed through a boundary between the cell array region and the peripheral circuit region to form an expanded air gap;
- and
- performing a second patterning process on the conductive layer to open the expanded air gap.
19-22. (canceled)
24-26. (canceled)
A method of fabricating a semiconductor device, the method comprising:
- forming conductive pillars on a substrate;
- sequentially forming a sacrificial layer and a molding structure between the conductive pillars;
- forming a conductive layer on the molding structure, such that the conductive layer is connected to the conductive pillars;
- removing the sacrificial layer, such that an air gap is formed between adjacent conductive pillars;
- removing the molding structure, such that an expanded air gap is formed between the adjacent conductive pillars;
- and
- patterning the conductive layer to form conductive patterns on respective conductive pillars, such that a space between the conductive patterns is in fluid communication with the expanded air gap.
28-37. (canceled)
Dependencies are inferred from the claim text.