Method Of Forming Chip With Through Silicon Via Electrode
AssigneeUnited Microelectronics Corp.
InventorsMing-Tse Lin, Chu-Fu Lin, Chien-Li Kuo, Yung-Chang Lin
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AssigneeUnited Microelectronics Corp.
InventorsMing-Tse Lin, Chu-Fu Lin, Chien-Li Kuo, Yung-Chang Lin
Estimating the term…
The present invention provides a method of forming a chip with TSV electrode. A substrate with a first surface and a second surface is provided. A thinning process is performed from a side of the second surface so the second surface becomes a third surface. Next, a penetration via which penetrates through the first surface and the third surface is formed in the substrate. A patterned material layer is formed on the substrate, wherein the patterned material layer has an opening exposes the penetration via. A conductive layer is formed on the third surface thereby simultaneously forming a TSV electrode in the penetration via and a surface conductive layer in the opening.
A method of forming a chip with a though-silicon-via (TSV) electrode, comprising:
A method of forming a chip with a though-silicon-via (TSV) electrode, comprising:
Dependencies are inferred from the claim text.