Increasing yield with tactile button gap adjustment
AssigneeMicrosoft Corporation
InventorMichael C. Gordon
Life of this patent
Estimating the term…
Abstract
Embodiments of the disclosure optimize yield of a product having one or more switch assemblies and improve impact robustness of the product without sacrificing tactile feel. Based on failure limits of a gap in the switch assembly during manufacturing, a single size for a shim is calculated. The shim is selectively inserted into the switch assembly based on the gap to maximize the switch assembly yield while minimizing cost. In some examples, a bracket is designed for the switch assemblies. The bracket has datum surfaces in three dimensions and a beam tuned to absorb energy during an impact event to prevent switch failure.
Claims20
A computing device having a switch assembly, the switch assembly comprising:
- a bracket having a plurality of datum surfaces in three dimensions, the plurality of datum surfaces comprising at least two datum feet each having a height, and a beam having a width and a thickness, wherein the height, width, and thickness are tuned to prevent switch failure during an impact event, wherein the plurality of datum surfaces form an impact area between a chassis of the computing device and the switch assembly to absorb energy to prevent the switch failure during the impact event;
- and
- a gap configured to receive a shim, the gap representing an amount of travel of a button to contact a switch actuator when a user presses the button, the shim having a size calculated to optimize a yield for a plurality of switch assemblies, the size being calculated based on defined failure limits of the gap for the plurality of switch assemblies, the size being the same for each of the plurality of switch assemblies.
A switch assembly comprising:
- a switch actuator that, when inserted into a chassis of a computing device, is configured to receive a button;
- and
- a gap configured to receive a shim, the gap representing an amount of travel of the button to contact the switch actuator when a user presses the button, the shim having a size calculated to optimize a yield for a plurality of switch assemblies, the size being calculated based on defined failure limits of the gap for the plurality of switch assemblies, the size being the same for each of the plurality of switch assemblies.
An automated method for assembling and testing a switch in a computing device, the method comprising:
- defining failure limits of a gap in a plurality of switch assemblies, each of the plurality of switch assemblies configured to receive a button, the gap in each of the plurality of switch assemblies representing an amount of travel from the button to a switch actuator;
- and
- based on the defined failure limits, calculating a single size for a shim, the single size being calculated to optimize a yield for the plurality of switch assemblies, wherein for each of the plurality of switch assemblies, the shim having the calculated single size is selectively inserted into the switch assembly based on the gap for the switch assembly.
Dependencies are inferred from the claim text.