Metal microparticles provided with projections
AssigneeM. Technique Co., Ltd.
InventorsMasaki MAEKAWA, Masakazu ENOMURA
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Abstract
In response to the demand for shape-controlled metal microparticles accompanying rapid development and progress in industry in recent years, metal microparticles, which have projections on the surfaces of the particles that are integrated with the particles, are provided. The metal microparticles have integrated conical projections on the surfaces of the particles, and at least some of the projections are more than ¼ of the size of the particles. The protrusions that protrude from the metal microparticles melt and deform at a temperature lower than the melting point of the metal itself.
Claims20
A metal microparticle, which includes a nickel element contained therein and comprises a particle main body and a plurality of projections sticking out from the particle main body,
- wherein a particle diameter of the particle main body is 5 μm or less, and
- wherein at least one projection of the plurality of projections tapers off to a point and has an apparent height by an electron microscope being in the range of more than ¼ to less than 8/4 relative to the particle diameter of the particle main body.
A metal microparticle, which includes a nickel element contained therein and comprises a particle main body and a projection sticking out from the particle main body,
- wherein a particle diameter of the particle main body is 5 μm or less, and wherein the projection is deformed by melting at a temperature lower than a melting point of a metal which constitutes the projection.
A metal microparticle, which includes a nickel element contained therein and comprises a particle main body and plural projections sticking out from the particle main body,
- wherein at least one projection of the plural projections tapers to a point, and an apparent width thereof by an electron microscope becomes gradually narrower from a base end to a front end thereof, and a longest apparent plain distance among the plural projections by the electron microscope is 7.5 μm or less, and an apparent height of the longest projection among the plural projections by the electron microscope is more than ⅙, relative to the longest apparent plain distance.
Dependencies are inferred from the claim text.