Temperature Tracking to Manage Threshold Voltages in a Memory
AssigneeSeagate Technology LLC
InventorsYoung Pil Kim, Rodney Virgil Bowman, Caitlin Marie Race, Don R. Bloyer
Life of this patent
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Abstract
Method and apparatus for managing data in a memory, such as a flash memory array. In accordance with various embodiments, a first data access operation is conducted on a memory cell and a first temperature associated with the memory cell and associated with the first data access operation is measured. A second temperature associated with the memory cell is measured. At least one operational parameter is adjusted responsive to the first and second temperatures associated with the memory cell. A second data access operation is conducted on the memory cell using the adjusted operational parameter.
Claims20
A method comprising:
- performing a first data access operation on a memory cell;
- measuring a first temperature associated with the first data access operation;
- subsequently measuring a second temperature associated with the memory cell;
- adjusting at least one operational parameter in response to the measured first and second temperatures;
- and
- performing a second data access operation on the memory cell using the adjusted at least one operational parameter.
A method comprising:
- programming a memory cell to a selected programmed state;
- measuring a first temperature associated with the programming of the memory and storing a corresponding first temperature value in a memory;
- subsequently measuring a second temperature value associated with the non-volatile memory cell responsive to a read command and storing a corresponding second temperature value in a memory;
- and
- performing a read operation responsive to the read command, the read operation comprising applying a read voltage threshold to the memory cell having a magnitude selected in relation to the first and second temperature values.
An apparatus comprising:
- a memory comprising a plurality of memory cells;
- and
- a control circuit adapted to perform a first data access operation on a memory cell, measure a first temperature associated with the memory cell, measure a second temperature associated with the memory cell, adjust at least one operational parameter responsive to the first and second temperatures associated with the memory cell, and perform a second data access operation on the memory cell using the adjusted at least one operational parameter.
Dependencies are inferred from the claim text.