Semiconductor device having a test controller and method of operation
AssigneeFreescale Semiconductor, Inc.
InventorsCHRIS P. NAPPI, Stephen F. McGinty
Life of this patent
Estimating the term…
Abstract
A semiconductor device includes a test port configured to communicate with a test system, a test command controller coupled to communicate with the test port, a peripheral module configured to communicate with the test command controller, a processor, and a test memory configured to communicate with the test command controller and the processor. The test command controller is configured to issue a first set of one or more instructions to test the peripheral module and to issue a second set of one or more instructions to the processor to process information in the test memory resulting from the test of the peripheral module.
Claims20
A semiconductor device, comprising:
- a test port configured to communicate with a test system;
- a test command controller coupled to communicate with the test port;
- a peripheral module configured to communicate with the test command controller;
- a processor;
- a test memory configured to communicate with the test command controller and the processor;
- wherein the test command controller is configured to issue a first set of one or more instructions to test the peripheral module and to issue a second set of one or more instructions to the processor to process information in the test memory resulting from the test of the peripheral module.
A method of testing a semiconductor device comprising:
- receiving via a test port a test command from a test system external to the semiconductor device;
- providing instructions based on the test command to a peripheral module on the semiconductor device to output a test parameter at a test point;
- measuring the test parameter using a measurement unit on the semiconductor device;
- storing the measured test parameter in a test memory on the semiconductor device;
- comparing the measured test parameter to a predetermined value, wherein the comparing is performed by a processor on the semiconductor device.
A semiconductor device comprising:
- a test port configured to receive test commands from a test system external to the semiconductor device;
- a test command controller coupled to the test port to receive the test commands, the test command controller is configured to interpret the test commands, translate the test commands to one or more instructions, and provide the instructions to at least one of a peripheral module and a processor, the peripheral module and the processor are on the semiconductor device;
- the peripheral module performs the one or more instructions;
- the processor is configured to process test data resulting from performing the one or more instructions.
Dependencies are inferred from the claim text.