Measurement apparatus and method thereof
AssigneeCanon Kabushiki Kaisha
InventorsMasayoshi Yamasaki, Toshihiro Kobayashi, Tomoaki Higo
Life of this patent
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AssigneeCanon Kabushiki Kaisha
InventorsMasayoshi Yamasaki, Toshihiro Kobayashi, Tomoaki Higo
Estimating the term…
Images are obtained from an imaging device. The images represent patterns projected in a time series by a projection device. Each pattern comprises dashed lines each of which has a predetermined width. A longitudinal direction of each dashed line is substantially perpendicular to a base line defined by a segment connecting optical centers of the projection and imaging devices. Each dashed line repeats light and dark in the longitudinal direction. The dashed lines are discriminated based on combinations of the light and dark in the images. Correspondences between projected coordinates and image coordinates of the dashed lines are detected based on information regarding the patterns and a discrimination result of the dashed lines. A three-dimensional shape of the object is calculated based on the correspondences, and calibration data of the projection and imaging devices.
A measurement apparatus for measuring a three-dimensional shape of an object to be measured using a projection device which projects a pattern to measurement space, and an imaging device which captures the measurement space, the apparatus comprising:
A method of measuring a three-dimensional shape of an object to be measured using a projection device which projects a pattern to measurement space, and an imaging device which captures the measurement space, the method comprising:
A non-transitory computer readable medium storing a computer-executable program for causing a computer to perform a method of measuring a three-dimensional shape of an object to be measured using a projection device which projects a pattern to measurement space, and an imaging device which captures the measurement space, the method comprising:
Dependencies are inferred from the claim text.