Systems and methods for regularized fourier analysis in x-ray phase contrast imaging
AssigneeGeneral Electric Company
InventorsJonathan Immanuel Sperl, Kinan Mahdi
Life of this patent
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Abstract
A method of regularization of x-ray phase contrast imaging (XPCi) system measurement data includes obtaining air scan data of the XPCi system prior to the presence of an object undergoing imaging, performing Fourier analysis of the air scan data, computing air coefficients from the result of the performing step, obtaining object scan data of an object undergoing imaging on the XPCi system, regularizing the object scan data, and calculating at least one of absorption image data, differential phase image data, and dark field image data by using object coefficients. A system configured to implement the method and a non-transitory computer-readable medium are disclosed.
Claims15
A method of regularization of x-ray phase contrast imaging (XPCi) system measurement data, the method comprising:
- obtaining air scan data of the XPCi system prior to the presence of an object undergoing imaging;
- performing Fourier analysis of the air scan data;
- computing air coefficients from the result of the performing step;
- obtaining object scan data of an object undergoing imaging on the XPCi system;
- regularizing the object scan data;
- and
- calculating at least one of absorption image data, differential phase image data, and dark field image data by using object coefficients.
A non-transitory computer-readable medium having stored thereon instructions which when executed by a processor cause the processor to perform a method of regularization of x-ray phase contrast imaging (XPCi) system measurement data, the method comprising:
- obtaining air scan data of the XPCi system prior to the presence of an object undergoing imaging;
- performing Fourier analysis of the air scan data;
- computing air coefficients from the result of the performing step;
- obtaining object scan data of an object undergoing imaging on the XPCi system;
- regularizing the object scan data;
- and
- calculating at least one of absorption image data, differential phase image data, and dark field image data by using object coefficients.
A system for regularization of x-ray phase contrast imaging (XPCi) system measurement data, the system comprising:
- an X-ray source configured to generate an X-ray beam directed toward the subject;
- a detector that in operation configured to detect at least a portion of the X-ray beam and to produce a signal corresponding to the detected portion of the X-ray beam;
- a grating system comprising one or more gratings located between the X-ray source and the detector;
- a control processor configured to receive the signal from the detector and to execute computer-readable instructions that cause the control processor to perform a method including:
- obtaining air scan data of the XPCi system prior to the presence of an object undergoing imaging;
- performing Fourier analysis of the air scan data;
- computing air coefficients from the result of the performing step;
- obtaining object scan data of an object undergoing imaging on the XPCi system;
- regularizing the object scan data;
- and
- calculating at least one of absorption image data, differential phase image data, and dark field image data by using object coefficients.
Dependencies are inferred from the claim text.