Esd/eos system level simulation tool

Abstract

Disclosed are exemplary embodiments of methods and systems for numerical simulation of Electrostatic Discharge (ESD) and Electrical Overstress (EOS) events applied to one or more component devices under test or devices under protection. In an example embodiment, a method generally includes providing access to centralized resources for industry standard nodal circuit or finite element analysis numerical simulation of electromagnetic events, as well as protecting intellectual property for some or all of the numerical models used in the simulation. In an exemplary embodiment, a numerical simulation system provides a platform for multiple users to utilize this platform simultaneously, select independent combinations of models and simulation parameters, execute these simulations and view, and store and retrieve these results independently. With such a simulation platform, a central or distributed repository of protected device models can be used as “black boxes” by system integrators to compare and contrast results in various combinations.

Dependencies are inferred from the claim text.