Systems and methods for conforming test tooling to integrated circuit device with heater socket

A coaxial test socket assembly useful in association with an integrated circuit (IC) device tester, the coaxial socket assembly comprising:

• a socket contactor frame with an opening configured to accommodate an IC device under test (DUT);
• a heater module having a heating plate, the heater module having a recess configured to provide access to the DUT;
• an array of coaxial pins having good thermal conductivity and good electrical signal transmission is configured to contact the DUT, wherein each of the coaxial pins includes:
• a spring-loaded metallic plunger;
• a metallic barrel wherein the spring-loaded metallic plunger can move inside the metallic barrel;
• and
• an insulating layer substantially surrounding the metallic barrel;
• a socket base hosting the top part of the array of coaxial pins;
• and
• a socket bottom hosting the bottom part of the array of coaxial pins.