Inter-terminal capacitance measurement method for three-terminal device and apparatus for the same
AssigneeKeysight Technologies, Inc.
InventorsKoji Tokuno, Yoshimi Nagai
Life of this patent
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AssigneeKeysight Technologies, Inc.
InventorsKoji Tokuno, Yoshimi Nagai
Estimating the term…
Provided are a measurement apparatus and a measurement method capable of measuring inter-terminal capacitances of a three-terminal device while reproducibility is high and influences of residual inductances are cancelled. The measurement apparatus includes: a route selector including a first terminal, a second terminal, a third terminal, a fourth terminal, a fifth terminal, and a sixth terminal, the fourth to sixth terminals being configured to connect to any of the first to third terminals; an LCR meter; a device under test, which is a three-terminal device; first, second, and third cables for respectively connecting the fourth to sixth terminals of the first route selector and first, second, and third terminals of the device under test to each other; and fourth, fifth, and sixth cables for respectively connecting the first to third terminals of the first route selector and first, second, and third terminals of the LCR meter to each other.
A method of measuring an inter-terminal capacitance of a device under test including three terminals, having:
A route selector, comprising:
Dependencies are inferred from the claim text.