Line testing device for array substrate having dense number of wires and method for testing line of the array substrate having the dense number of wires
AssigneeShenzhen China Star Optoelectronics Technology Co., Ltd.
InventorXiangyang XU
Life of this patent
Estimating the term…
Abstract
A line testing device for an array substrate having a dense number of wires. includes a signal generating device that generates a detection signal, a signal receiving device that receives and processes the detection signal, and a control divice. The detection signal tests the array substrate having the dense number of wires, and the control device controls one or more of the signal generating device and the signal receiving device to move in a direction perpendicular to a direction of a scan line of the array substrate and in a plane parallel to the array substrate.
Claims10
A line testing device for an array substrate having a dense number of wires, comprising:
- a signal generating device that generates a detection signal;
- a signal receiving device that receives and processes the detection signal;
- and
- a control device;
- wherein the detection signal tests the array substrate having the dense number of wires, and the control device controls any one or more of the signal generating device and the signal receiving device to move in a direction perpendicular to a direction of a scan line of the array substrate and in a plane parallel to the array substrate.
A method for testing a line of an array substrate having a dense number of wires, comprising:
- arranging an array substrate on a line testing device to be detected, and adjusting a position and calibration of the line testing device;
- making one or more of a signal generating device and a signal receiving device move in a direction perpendicular to a direction of a scan line of the array substrate and in a plane parallel to the array substrate, and forming one circuit between an input sensor of the signal generating device and an output sensor of the signal receiving device through single line of the array substrate;
- and
- analyzing the detection signal received by the signal receiving device, and comparing the detection signal with an original detection signal;
- if result of the comparison is more than or equal to a preset deviation threshold, the single line detected is abnormal, if the result of the comparison is less than the preset deviation difference, the single line detected is normal.
Dependencies are inferred from the claim text.