Computer-Aided Simulation Method For Atomic-Resolution Scanning Seebeck Microscope (SSM) Images

Abstract

A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position, using the following equation: V  ( r ) = V diff + S coh  ( r )  ∫ ∇ T  ( r ; r ′ ) · r ′ - r  r ′ - r  3   3  r ′ in which V(r) denotes the local thermoelectric voltage, Vdiff denotes a thermoelectric voltage drop in a diffusive transport region in a tip and a sample, Scoh(r) denotes a position-dependent Seebeck coefficient, r denotes a distance measured from a point voltage probe, r′ denotes material internal coordinates, ∇T(r;r′) denotes a temperature gradient radially weighted by a factor of 1/r2, and ∫ ∇ T  ( r ; r ′ ) · r ′ - r  r ′ - r  3   3  r ′ denotes a volume integral of a temperature profile.

Dependencies are inferred from the claim text.