Systems and methods for particle classification and sorting

Abstract

A particle analysis system includes an inlet; an inertial focusing microchannel disposed in a substrate and having a downstream expanding region at a distal end, where the inlet is connected to a proximal end of the microchannel; a plurality of outlets connected to the microchannel at the downstream expanding region; a plurality of fluidic resistors, where each fluidic resistor is connected to a respective outlet; and a particle analyzer configured to measure a size and a position of particles in the microchannel. A particle sorting system includes an inlet; an inertial focusing microchannel disposed in a substrate and having a downstream expanding region at a distal end, where the inlet is connected to a proximal end of the microchannel; a plurality of outlets connected to the microchannel at the downstream expanding region; and a plurality of fluidic resistors, where each fluidic resistor is connected to a respective outlet.

Dependencies are inferred from the claim text.