Inspecting device and inspecting method

4:

• The inspecting device according to claim 1, wherein
• the range of the slope, on the basis of the local slope at the designated point and the second parameter, is
• from a value obtained by multiplying the local slope at the designated point by a value obtained by subtracting the second parameter from 1
• to a value obtained by multiplying the local slope at the designated point with a value obtained by adding the second parameter to 1.

5:

• The inspecting device according to claim 1, wherein
• the inspection unit
• specifies two second change points having the designated point sandwiched therebetween, and
• calculates an elastic force of the elastic component at an arbitrary position on the basis of a force waveform between the two second change points.

6:

• The inspecting device according to claim 1, wherein
• the inspection unit
• specifies two second change points having the designated point sandwiched therebetween, and
• calculates a modulus of elasticity of the elastic component on the basis of a force waveform between the two second change points.

7:

• An inspecting method executed by an inspecting device including a force-waveform detection system, a reception unit, and an inspection unit, the inspecting method comprising:
• a first step at which the force-waveform detection system
• applies a load to an assembled body having an elastic component assembled thereto in a direction of action of the elastic component, and
• acquires a force waveform describing a relation between the load and an amount of displacement;
• a second step at which the reception unit receives an input of a designated point during a process of deformation of the elastic component in the force waveform acquired by the force-waveform detection system;
• and
• a third step at which the inspection unit
• calculates a local slope of the force waveform at the designated point,
• calculates a local slope at a focus point different from the designated point, and
• determines, on the basis of a comparison between the local slope at the focus point and the local slope at the designated point, whether the focus point is a change point of the force waveform, wherein
• the third step includes
• a step of searching for a first focus point that first satisfies, on the basis of the local slope at the designated point and a first parameter, a first condition that at least states that the local slope at the first focus point reaches a first threshold, while moving the first focus point in a direction away from the designated point by using the designated point as a point of the starting, thereby specifying the first focus point first satisfying the first condition as a first change point, and
• a step of searching for a second focus point that first satisfies, on the basis of a second parameter, a second condition that at least states that the local slope at the second focus point reaches the local slope at the designated point or is inside of a range between the local slope at the designated point and the slope, while moving the second focus point in a direction approaching the designated point by using the first change point as a point of the starting, thereby specifying the second focus point first satisfying the second condition as a second change point.