Projective optical metrology system

A projective optical metrology system comprising a first and a second optical units, the first optical unit comprising:

• an optical input configured to receive a first light signal;
• a number of optical paths;
• a separator configured to separate a number of components of the first light signal received by the optical input and to couple each of the separated components to a corresponding optical path;
• and
• a light target designed to emit a second light signal and formed by a number of light elements, each light element being optically coupled to a corresponding optical path, so as to be illuminated, in use, by the component of the first light signal coupled to said corresponding optical path;
• and wherein the second optical unit comprises:
• a light source designed to generate said first light signal;
• an optoelectronic sensor designed to receive said second light signal, such that said second light signal forms an image of the light target on said optoelectronic sensor;
• and
• an electronic processing unit configured to determine at least one quantity indicative of the mutual arrangement of the light target and the second optical unit, on the basis of said image.