Multilayer thin film for cutting tool and cutting tool including the same

Abstract

Provided is a multilayer thin film for a cutting tool, in which micro-scale thin films having a thickness of a few nanometers to tens of nanometers are alternately stacked, having less quality variations and being capable of realizing excellent wear resistance. The multilayer thin film according to the present disclosure is a multilayer thin film for a cutting tool, in which unit thin films which are respectively formed of thin layers A, B, C, and D are stacked more than once, wherein elastic moduluses k of the thin layers satisfy relationships of kA>kB, kD>kC or kC>kB, kD>kA, lattice parameters L of the thin layers satisfy relationships of LA, LC>LB, LD or LB, LD>LA, LC, and a difference between maximum and minimum values of the lattice parameter L is 20% or less.

Dependencies are inferred from the claim text.