Electronic device and measuring method thereof
AssigneesFu Tai Hua Industry (Shenzhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
InventorsCHIH-KUANG CHANG, XIN-YUAN WU, HENG ZHANG
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Abstract
An electronic device having a processing unit and a storage device is disclosed. The storage device stores a plurality of instructions. When the plurality of instructions are executed by the processing unit, the processing unit controls a scanning device coupled to the electronic device to scan an object for a point cloud, and converts the point cloud into a mesh model. Then, the processing unit selects a measured point from the mesh model, computes first coordinates of the measured point based on the mesh model, and simulates a motion path of a testing unit based on the first coordinates of the measured point.
Claims13
An electronic device comprising:
- a processing unit;
- and
- a storage device that stores a plurality of instructions, when executed by the processing unit, causes the processing unit to:
- control a scanning device coupled to the electronic device to scan an object for a point cloud;
- convert the point cloud into a mesh model;
- select a measured point from the mesh model;
- compute first coordinates of the measured point based on the mesh model;
- and
- simulate a motion path of a testing unit based on the first coordinates of the measured point.
A measuring method for measuring an object in three dimensions executed by an electronic device, the method comprising:
- receiving a point cloud of the object;
- converting the point cloud into a mesh model;
- receiving a measured point selected from the mesh model;
- computing first coordinates of the measured point based on the mesh model;
- and
- simulating a motion path of a testing unit based on the first coordinates of the measured point.
An electronic device comprising:
- a scanning device;
- and
- one or more processors communicatively coupled to the scanning device and configured to receive executable instructions to:
- scan an object for a point cloud;
- convert the point cloud into a mesh model;
- select a measured point from the mesh model;
- compute a first set of coordinates of the measured point;
- and
- simulate a motion path of a testing unit based on the first set of coordinates.
Dependencies are inferred from the claim text.