Method and apparatus for testing memory
AssigneeWistron Corporation
InventorMin-Hua Hsieh
Life of this patent
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Abstract
A method and an apparatus for testing a memory are provided, and the method is adapted for an electronic apparatus to test the memory. In the method, a left edge and a right edge of a first waveform of a clock signal for testing the memory are scanned to obtain a maximum width between two cross points of the left edge and the right edge. A central reference voltage of a data signal outputted by the memory is obtained, and a data width between two cross points of the central reference voltage and a left edge and a right edge of a second waveform of the data signal is obtained. Whether a difference between the data width and the maximum width is greater than a threshold is determined; if the difference is greater than the threshold, the memory is determined to be damaged.
Claims12
A method for testing a memory, adapted for an electronic apparatus to test the memory, comprising:
- scanning a left edge and a right edge of a first waveform of a clock signal for testing the memory to obtain a maximum width between two cross points of the left edge and the right edge;
- obtaining a central reference voltage of a data signal outputted by the memory;
- obtaining a data width between two cross points of the central reference voltage and a left edge and a right edge of a second waveform of the data signal;
- determining whether a difference between the data width and the maximum width is greater than a threshold;
- and
- if the difference is greater than the threshold, determining the memory is damaged.
An apparatus for testing a memory, comprising:
- a clock generator, coupled to the memory and configured to generate a clock signal for testing the memory and output the clock signal to the memory;
- a waveform scanner, coupled to the clock generator, and configured to scan a left edge and a right edge of a first waveform of the clock signal to obtain a maximum width between two cross points of the left edge and the right edge;
- a data analyzer, coupled to the memory, and configured to obtain a central reference voltage of a data signal outputted by the memory and obtain a data width between two cross points of the central reference voltage and a left edge and a right edge of a second waveform of the data signal;
- and
- a comparator, coupled to the waveform generator and the data analyzer, and configured to determine whether a difference between the data width and the maximum width is greater than a threshold and determine the memory is damaged if the difference is greater than the threshold.
Dependencies are inferred from the claim text.