Method and apparatus for analyzing materials by using pattern analysis of harmonic peaks
AssigneeElectronics and Telecommunications Research Institute
InventorsHyo Bong HONG, Jae Ho Lim, Sung Woong Shin
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Abstract
The present invention provides an apparatus and a method for analyzing materials by using pattern analysis of harmonic peaks. The apparatus for analyzing materials according to the present invention comprises a generating unit generating two or more electromagnetic fields, a detecting unit detecting a magnetization signal generated from a measurement target material as an electromagnetic field is applied to the measurement target material, and an analyzing unit analyzing type of the measurement target material based on a harmonic pattern obtained from the magnetization signal.
Claims20
An apparatus for analyzing materials, comprising:
- a generating unit generating two or more electromagnetic fields;
- a detecting unit detecting a magnetization signal generated from a measurement target material as an electromagnetic field is applied to the measurement target material;
- and
- an analyzing unit analyzing type of the measurement target material based on a harmonic pattern obtained from the magnetization signal.
An apparatus for analyzing materials, comprising:
- two or more generators generating alternating currents of different frequencies;
- two or more excitation coils receiving the alternating currents and generating an electromagnetic field;
- a detection coil detecting a magnetized coil generated from a measurement target material as the electromagnetic field is applied to the measurement target material;
- and
- an analyzer analyzing the type of the measurement target material based on a harmonic pattern obtained from the magnetization signal.
In a method by which an apparatus for analyzing materials analyzes a measurement target material, a method for analyzing materials, comprising:
- generating two or more electromagnetic fields;
- applying the electromagnetic fields to a measurement target material;
- detecting a magnetization signal generated from the measurement target material as the electromagnetic field is applied to the measurement target material;
- and
- analyzing type of the measurement target material based on a harmonic pattern obtained from the magnetization signal.
Dependencies are inferred from the claim text.