Acoustic testing of sapphire components for electronic devices
AssigneeApple Inc.
InventorsDale N. Memering, Matthew Rogers, Theodore A. Waniuk
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Abstract
In some embodiments, processes for testing for structural flaws in sapphire parts such as display cover plates used in the manufacturing of electronic devices are disclosed. A process may include transmitting a destructive acoustic signal onto a sapphire part, and determining whether the sapphire part failed in response to the destructive signal. The destructive acoustic signal may include a Rayleigh acoustic wave, wherein the destructive acoustic signal breaks the sapphire part if the sapphire part has a surface flaw larger than a specified size. In this manner, only sapphire parts that can withstand the destructive acoustic signal are used in manufacturing of the electronic device.
Claims17
A process for testing for structural flaws in sapphire parts used in the manufacturing of electronic devices, comprising:
- transmitting a destructive acoustic signal onto a sapphire part;
- and
- determining whether the sapphire part mechanically failed in response to the transmitting of the destructive acoustic signal.
A process for manufacturing an electronic device, comprising:
- generating and transmitting a destructive acoustic signal onto a sapphire part;
- determining whether the sapphire part mechanically failed in response to the transmitting of the destructive acoustic signal;
- and
- in response to determining the sapphire part did not fail, forming the electronic device using the sapphire part.
A system for use in manufacturing an electronic device, the system comprising:
- a sapphire part having a surface;
- and
- a transmitter configured to transmit a destructive signal onto the sapphire part,
- wherein the sapphire part having a flaw larger than a specified size in the surface breaks in response to the destructive signal, thereby eliminating the sapphire part from use in manufacturing the electronic device.
Dependencies are inferred from the claim text.