Persistent feature detection
AssigneeBt Imaging Pty Ltd
InventorIan Andrew MAXWELL
Life of this patent
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Abstract
Methods are presented for improved detection of persistent or systematic defects induced during the manufacture of a product. In particular, the methods are directed to the detection of defects induced systematically in the manufacture of photovoltaic cells and modules. Images acquired from a number of samples are combined, enhancing the systematic defects and suppressing random features such as variations in material quality. Once a systematic defect is identified, steps can be taken to locate and rectify its cause.
Claims21
An apparatus for detecting systematic features in products being manufactured on a process line, said apparatus comprising:
- a camera configured to acquire images of a plurality of products, each image being of substantially the same area on each of said products;
- and
- a processor configured to combine said images and obtain a super-image, process said super-image to identify regions with strong signals, and identify said regions as being indicative of systematic features in said products.
An apparatus for detecting systematic features in products being manufactured on a process line, said apparatus comprising:
- a camera configured to acquire images of a plurality of products, each image being of substantially the same area on each of said products;
- and
- a processor configured to combine said images and obtain a super-image, process said super-image to identify regions with strong signals, compare said regions with known features in said area, and identify those of said regions that do not correspond to said known features as being indicative of systematic features in said products.
An apparatus for detecting process-induced defects in products being manufactured on a process line, said apparatus comprising:
- a camera configured to acquire images of corresponding areas of a plurality of products;
- and
- a processor configured to cumulate said images and produce a cumulative image and identify signals in said cumulative image which exceed a predetermined threshold, thereby determining said process-induced defects.
An apparatus for detecting process-induced defects in products being manufactured on a process line, said apparatus comprising:
- a camera configured to acquire images of corresponding areas of a plurality of products;
- and
- a processor configured to cumulate said images and produce a cumulative image, identify signals in said cumulative image which exceed a predetermined threshold, thereby determining one or more defect candidates, and exclude from said candidates any known features, thereby determining said process-induced defects.
In a process line for manufacturing products, an apparatus for detecting systematic features in products being manufactured on said process line, said apparatus comprising:
- a camera configured to acquire images of a plurality of said products, each image being of substantially the same area on each of said products;
- and
- a processor configured to combine said images and obtain a super-image, process said super-image to identify regions with strong signals, and identify said regions as being indicative of systematic features in said products.
In a process line for manufacturing products, an apparatus for detecting process-induced defects in products being manufactured on said process line, said apparatus comprising:
- a camera configured to acquire images of corresponding areas of a plurality of said products;
- and
- a processor configured to cumulate said images and produce a cumulative image, and identify signals in said cumulative image which exceed a predetermined threshold, thereby determining said process-induced defects.
Dependencies are inferred from the claim text.