Multiple parallel confocal system and surface measurement method using the same
AssigneeIndustry-Academic Cooperation Foundation, Yonsei University
InventorShinill Kang
Life of this patent
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Abstract
The present invention relates to a multiple parallel confocal system including: a light source for irradiating light; a relay lens unit through which the light traveling toward a measuring object or the light reflected from the measuring object is passed, the relay lens unit having one or more lens for focusing the light irradiated from the light source; a multiple optical probe having a microlens array on which a plurality of microlenses is arranged, the microlenses into which the focused light through the relay lens unit is incident; and a photo detector for detecting the incident light reflected from the measuring object and passed through the microlenses and the relay lens unit.
Claims15
A multiple parallel confocal system comprising:
- a light source for irradiating light;
- a relay lens unit through which the light traveling toward a measuring object or the light reflected from the measuring object is passed, the relay lens unit having one or more lens for focusing the light irradiated from the light source;
- a multiple optical probe having a microlens array on which a plurality of microlenses is arranged, the microlenses into which the focused light through the relay lens unit is incident;
- and
- a photo detector for detecting the incident light reflected from the measuring object and passed through the microlenses and the relay lens unit,
- wherein a working distance between each microlens and the measuring object is increased, and a back focus determined by the focal distance of each microlens and the working distance between the microlens and the measuring object and a focus of the relay lens unit are located on the same plane, the back focus being calculated by the following expression:
- BFL=f(f+x)/x
- wherein f denotes the focal distance of each microlens and f+x denotes the distance between each microlens and the measuring object, and
- wherein an aperture is disposed on a focal plane where the focuses of the relay lens unit and the back focuses of the microlenses meet, the aperture having pinholes formed thereon.
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Dependencies are inferred from the claim text.