Optical measurement probe, and optical measurement device provided with the same

Abstract

There are provided an optical measurement probe capable of obtaining a more stable measurement result, and an optical measurement device provided with the same. An incidence surface of an optical window to be used in a high temperature environment is covered by a deposited film. The optical window is formed of sapphire, and the deposited film is formed from SiO2. Adhesion of dirt to the incidence surface, and an influence, on a measurement result, of the adhesion of dirt on the incidence surface can thereby be prevented, and a more stable measurement result can be obtained.

Dependencies are inferred from the claim text.